Two-stage etching process

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United States of America Patent

PATENT NO 6787054
SERIAL NO

10358086

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Abstract

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A process for etching a substrate and removing etch residue deposited on the surfaces in the etching chamber has two stages. In the first stage, an energized first process gas is provided in the chamber, and in the second stage, an energized second process gas is provided in the chamber. The energized first process gas comprises SF.sub.6 and Ar, the volumetric flow ratio of SF.sub.6 to other components of the first process gas being from about 5:1 to about 1:10. The energized second process gas comprises CF.sub.4 and Ar, the volumetric flow ratio of CF.sub.4 to other components of the second process gas being from about 1:0 to about 1:10.

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Patent Owner(s)

Patent OwnerAddress
WANG XIKUNNot Provided

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Pan, Shaoher X 1133 Kelez Dr., San Jose, CA 95120 89 2680
Wang, Xikun 1281 Ayala Dr., #2, Sunnyvale, CA 94086 61 7960
Williams, Scott 107 S. Mary Ave., #102, Sunnyvale, CA 94086 87 2128

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