Method and device for measuring the optical properties of at least two regions located at a distance from one another in a transparent and/or diffuse object

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United States of America Patent

PATENT NO 6806963
SERIAL NO

10130994

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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An optical arrangement of the Michelson interferometer type having a measuring arm for measuring optical properties of at least two mutually spaced regions in an optically transparent and/or diffusive object. A reference arm has a path length variation unit which generates a periodic change in path length for the radiation in the reference arm. Arranged in the measuring arm upstream of the object is a detour unit. The detour unit imparts a detour which is larger than at least one second measuring beam into at least one measuring beam. The detour unit selects a detour to be equal to a distance between regions to be measured in the object. Using the optical arrangement the object is irradiated with the aid of a number of measuring beams corresponding to the number of regions. In each case two measuring beams have an optical path difference which corresponds to a geometrical distance between two regions. Each reflection beam of the measuring beams which is reflected by one of the regions is superimposed in an interfering fashion with a third beam having a temporal variation in path length, and is detected. This arrangement can carry out 'in-vivo' measurements of distances, thicknesses, at and/or in the human eye with the minimization of measuring errors within a sub-second time. The object does not have to be fixed during the measurement.

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Patent Owner(s)

  • HAAG-STREIT AG

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Schmid, Gregor F Saviese, CH 6 428
Walti, Rudolf Liebefeld, CH 1 194

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