Adaptive off tester screening method based on intrinsic die parametric measurements
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Oct 19, 2004
Grant Date -
N/A
app pub date -
Jul 16, 2002
filing date -
May 17, 2002
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A method for adaptively providing parametric limits to identify defective die quantizes the die into a plurality of groups according to statistical distributions, such as intrinsic speed in one embodiment. For each quantization level, an intrinsic distribution of the parameter is derived. Adaptive screening limits are then set as a function of the intrinsic distribution. Dies are then screened according to their parametric values with respect to the adaptive limits.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Advertisement
Advertisement
Advertisement
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully