Time-interleaved sampling of voltages for improving accuracy of temperature remote sensors

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United States of America Patent

PATENT NO 6808307
SERIAL NO

10051332

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Abstract

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A method and apparatus improves the accuracy of temperature measurements by sampling measurements from a remote sensor, where currents of different current densities are applied to the remote sensor in a time-interleaved fashion. The remote sensor includes at least one PN junction that produces a voltage corresponding to the applied current at each instance of time, and related to the temperature of the remote sensor. By applying time-interleaved current densities to the remote sensor, adverse effects from temperature variations during the measurement are minimized. Sequences of current biases having differing current densities in a forward order are applied to the remote sensor, followed by the same sequence being applied to the remote sensor in a reverse order. Similarly, a random or pseudo-random sequence may be employed in a forward and reverse order. The application of forward and reverse sequences is utilized to minimize errors in the temperature measurement.

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Patent Owner(s)

Patent OwnerAddress
NATIONAL SEMICONDUCTOR CORPORATION12500 TI BOULEVARD M/S 3999 DALLAS TX 75243

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Aslan, Mehmet Milpitas, CA 32 538
Henderson, Richard Dean Sunnyvale, CA 8 133
Ng, Chungwai Benedict Mountain View, CA 6 102
Oshima, Hideya Santa Clara, CA 10 158
Ren, Qing Feng San Jose, CA 4 68
Wong, Michael Santa Clara, CA 77 2995

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