Apparatus and method for measuring bit error rate in an OFDM communication system

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United States of America Patent

PATENT NO 6810020
APP PUB NO 20020004920A1
SERIAL NO

09772207

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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Disclosed is an apparatus for measuring a bit error rate (BER) in an orthogonal frequency division multiplexing (OFDM) communication system. A transmitter includes a pilot pattern inserter for inserting a first reference pilot pattern in subchannels of input data, and an OFDM modulator for OFDM-modulating the reference pilot pattern-inserted transmission data. A receiver includes a pilot pattern detector for OFDM-demodulating a data symbol received in a frame unit and detecting only a pilot pattern, and a BER operator for comparing the demodulated pilot pattern with a second reference pilot pattern, detecting and accumulating the number of pilot errors, and measuring a bit error rate by dividing the accumulated number of the pilot errors by the number of total received pilot patterns.

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Patent Owner(s)

Patent OwnerAddress
SAMSUNG ELECTRONICS CO LTD129 SAMSUNG-RO YEONGTONG-GU SUWON-SI GYEONGGI-DO 16677 16677

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Cho, Eun-Ee Daegu-kwangyeok-shi, KR 1 34
Kim, Ho Seoul, KR 72 2413
Park, Jong-Hyeon Seoul, KR 19 605

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