Method for developing processing and apparatus for supplying developing solution

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United States of America Patent

PATENT NO 6811962
APP PUB NO 20030044731A1
SERIAL NO

10227814

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Abstract

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In a developing processing of a wafer having a resist film low in the dissolving rate in a developing solution formed thereon and subjected to an exposure treatment, a developing solution of a low concentration is supplied first onto a wafer and the wafer is left to stand for a prescribed time to permit a developing reaction to proceed, followed by further supplying a developing solution having a concentration higher than that of the developing solution supplied first onto the wafer, leaving the substrate to stand and subsequently rinsing the wafer, thereby improving the uniformity of the line width in the central portion and the peripheral portion of the wafer.

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Patent Owner(s)

Patent OwnerAddress
TOKYO ELECTRON LIMITED3-1 AKASAKA 5-CHOME MINATO-KU TOKYO 1076325 ?1076325

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kyouda, Hideharu Kumamoto, JP 38 344
Ookouchi, Atsushi Kumamoto, JP 19 162
Takeguchi, Hirofumi Kumamoto, JP 32 294
Tanaka, Keiichi Kumamoto, JP 226 4320
Yamamoto, Taro Kumamoto, JP 103 988
Yoshihara, Kousuke Kumamoto, JP 113 1395

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