Methods, systems, and computer program products for modeling inductive effects in a circuit by combining a plurality of localized models
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United States of America Patent
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Nov 16, 2004
Grant Date -
Sep 18, 2003
app pub date -
Mar 12, 2002
filing date -
Mar 12, 2002
priority date (Note) -
Expired
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Abstract
Inductive effects in an integrated circuit device and/or system are modeled by partitioning the integrated circuit device and/or system into multiple windows or portions and determining a first localized inductance matrix for a first portion of the circuit and/or system and a second localized inductance matrix for a second portion of the circuit and/or system. The first and second localized inductance matrices are solved to obtain first and second localized susceptance vectors. The first and second localized susceptance vectors may be combined to form a susceptance matrix, which may be used directly in a susceptance-based simulator, or inverted to obtain a sparser inductance matrix that is representative of the inductive couplings in the entire integrated circuit device and/or system.
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