System and method for determining measurement errors of a testing device
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United States of America Patent
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Nov 23, 2004
Grant Date -
Oct 7, 2004
app pub date -
Apr 4, 2003
filing date -
Apr 4, 2003
priority date (Note) -
In Force
status (Latency Note)
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Abstract
A system and method are disclosed which provide for flexible and accurate test apparatus error value calculation. Error value calculation of a testing apparatus requires at least one unique measurement for each unknown error value using the equation that relates the measured response, the predicted response and the error value. When more equations than unknowns can be acquired, the system of equations is over-determined and an improvement of accuracy is possible, but accuracy may be lost when the predicted responses are not trusted to the same degree. The disclosed system and method provide the increased accuracy of an over-determined system, while accounting for predicted responses of varying degrees of trust.
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