Physical design characterization system
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United States of America Patent
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Nov 23, 2004
Grant Date -
Oct 23, 2003
app pub date -
Apr 23, 2002
filing date -
Apr 23, 2002
priority date (Note) -
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status (Latency Note)
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Abstract
A system, method and media for locating and defining process sensitive sites isolated to specific geometries or shape configurations within chip design data. Once a systemic process sensitive site is identified, a 3D design checking deck is coded and executed through a design checker on physical design data. Target match shapes are produced and embedded back into the design data. Pictures, maps and coordinates of process sensitive sites are produced and sent to a website library for reference.
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