Programmable memory devices with latching buffer circuit and methods for operating the same

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United States of America Patent

PATENT NO 6826082
APP PUB NO 20030210576A1
SERIAL NO

10403739

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Abstract

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Programmable memory devices include a memory cell having an associated bit line. A buffer circuit couples the bit line to a data line. The buffer circuit has a sense node coupled to the bit line and includes a latch circuit having a latch node coupled to the data line. A control circuit resets the latch node between a program operation of the memory cell and its corresponding program-verify operation. The memory devices may be NAND-type flash memory devices and the memory cell may be one of a string of memory cells connected in series between the bit line and a common source line. A transistor may couple the data line to the latch node and a transistor may couple the latch node to the sense node. Methods of operating the same are also provided.

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Patent Owner(s)

Patent OwnerAddress
SAMSUNG ELECRONICS CO LTD416 MAETAN-DONG YEONGTONG-GU SUWON-SI GYEONGGI-DO 442-370

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hwang, Sang-Won Gyeonggi-do, KR 28 647
Lee, Sung-Soo Gyeonggi-do, KR 93 1260

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