Method for applying uniform pressurized film across wafer

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United States of America Patent

PATENT NO 6828227
SERIAL NO

10289957

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Abstract

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A method of manufacturing semiconductor devices using an improved planarization process for the planarization of the surfaces of the wafer on which the semiconductor devices are formed. The improved planarization process includes the formation of a flat planar surface from a deformable coating on the surface of the wafer using a fixed resilient flexible material member contacting the wafer.

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Patent Owner(s)

Patent OwnerAddress
U S BANK NATIONAL ASSOCIATION AS COLLATERAL AGENT633 WEST FIFTH STREET 24TH FLOOR LOS ANGELES CA 90071

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Blalock, Guy T Boise, ID 151 4037
Carroll, Lynn J Middleton, ID 7 71
Stroupe, Hugh E Boise, ID 30 1561

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