Importance

Loading Importance Indicators...

Abstract

Method and apparatus for testing a device embedded in a programmable logic device is described. Because an embedded device, such as a microprocessor core, comprises more input and output pins than a programmable logic device, such as a field programmable gate array, in which it is located, providing a test vector wider than the number of external input and output pins of the programmable logic device is problematic. To solve this problem, at least a portion of the programmable logic device is programmed to function as a vector controller, where a test vector may be provided to the vector controller in sections, reassembled by the vector controller and provided to the embedded device after reassembly. Moreover, a test vector result in response to the test vector input is obtained by the vector controller and sectioned for outputting.

Loading the Abstract Image...

First Claim