US Patent No: 6,839,964

Number of patents in Portfolio can not be more than 2000

Method for manufacturing a multi-layer printed circuit board

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Abstract

A method of manufacturing a multilayer printed circuit board (PCB) is provided, the PCB having blind vias connecting to power layers. A portion of the blind vias in the power layers are grouped together to form a cluster of blind vias. Signal layers, provided separate from the power layers, include signal routing channels, with at least some of the signal routing channels aligned above or below the cluster of blind vias of the power layers.

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First Claim

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Patent Owner(s)

Patent OwnerAddressTotal Patents
FORMFACTOR, INC.LIVERMORE, CA440

International Classification(s)

  • [Classification Symbol]
  • [Patents Count]

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Henson, Roy Pleasanton, CA 2 132

Cited Art

Patent Info (Count) # Cites Year
 
INTERNATIONAL BUSINESS MACHINES CORPORATION (8)
4,868,350 High performance circuit boards 29 1988
4,864,722 Low dielectric printed circuit boards 31 1988
4,916,260 Circuit member for use in multilayered printed circuit board assembly and method of making same 18 1988
5,191,174 High density circuit board and method of making same 111 1990
5,225,777 High density probe 55 1992
5,371,654 Three dimensional high performance interconnection package 214 1992
6,378,201 Method for making a printed circuit board 34 1995
5,822,856 Manufacturing circuit board assemblies having filled vias 160 1996
 
FORMFACTOR, INC. (4)
5,476,211 Method of manufacturing electrical contacts, using a sacrificial member 353 1993
5,917,707 Flexible contact structure with an electrically conductive shell 288 1994
5,806,181 Contact carriers (tiles) for populating larger substrates with spring contacts 253 1997
6,050,829 Making discrete power connections to a space transformer of a probe card assembly 154 1997
 
FREESCALE SEMICONDUCTOR, INC. (2)
5,534,784 Method for probing a semiconductor wafer 116 1994
5,554,940 Bumped semiconductor device and method for probing the same 93 1994
 
KABUSHIKI KAISHA TOSHIBA (2)
5,488,542 MCM manufactured by using thin film multilevel interconnection technique 54 1994
6,121,554 Printed wiring board 14 1997
 
ADVANCED SEMICONDUCTOR ENGINEERING, INC. (1)
5,509,200 Method of making laminar stackable circuit board structure 55 1994
 
CIRCUIT COMPONENTS, INCORPORATED (1)
5,309,324 Device for interconnecting integrated circuit packages to circuit boards 86 1991
 
DELL USA, L.P. (1)
5,912,809 Printed circuit board (PCB) including channeled capacitive plane structure 122 1997
 
HUGHES ELECTRONICS CORPORATION (1)
5,148,103 Apparatus for testing integrated circuits 146 1990
 
INTEL CORPORATION (1)
5,557,502 Structure of a thermally and electrically enhanced plastic ball grid array package 81 1995
 
MEDALLION TEHNOLOGY, LLC (1)
5,045,975 Three dimensionally interconnected module assembly 40 1989
 
MICRO-PROBE, INC. (1)
4,837,622 High density probe card 93 1988
 
MITEL SEMICONDUCTOR LIMITED (1)
5,786,701 Bare die testing 60 1996
 
MOTOROLA, INC. (1)
4,513,355 Metallization and bonding means and method for VLSI packages 93 1983
 
NCR CORPORATION (1)
4,799,128 Multilayer printed circuit board with domain partitioning 56 1987
 
NEC CORPORATION (1)
5,322,593 Method for manufacturing polyimide multilayer wiring substrate 20 1992
 
NEC TOPPAN CIRCLE SOLUTIONS, INC. (1)
4,668,332 Method of making multi-layer printed wiring boards 22 1985
 
NEC TOPPAN CIRCUIT SOLUTIONS, INC. (1)
5,218,761 Process for manufacturing printed wiring boards 24 1992
 
NXP B.V. (1)
5,491,426 Adaptable wafer probe assembly for testing ICs with different power/ground bond pad configurations 76 1994
 
ROBERT BOSCH GMBH (1)
5,363,280 Printed circuit board or card thermal mass design 51 1993
 
SHINKO ELECTRIC INDUSTRIES CO., LTD. (1)
5,464,950 Aluminum nitride circuit board and method of producing same 10 1993
 
SILICON BANDWIDTH, INC. (1)
5,543,586 Apparatus having inner layers supporting surface-mount components 72 1994
 
SILICON GRAPHICS INTERNATIONAL, CORP. (1)
5,185,502 High power, high density interconnect apparatus for integrated circuits 32 1990
 
SPRING AIR INTERNATIONAL LLC (1)
6,249,924 Anti-roll off mattress construction 18 1997
 
SUN MICROSYSTEMS, INC. (1)
5,701,085 Apparatus for testing flip chip or wire bond integrated circuits 37 1995
 
SV PROBE PTE LTD. (1)
5,521,518 Probe card apparatus 130 1991
 
TAICHI HOLDINGS, LLC (1)
6,653,574 Multi-layered substrate with a built-in capacitor design and a method of making the same 5 2001
 
OTHER [CHECK PATENT PROFILE FOR ASSIGNMENT INFORMATION] (1)
5,623,160 Signal-routing or interconnect substrate, structure and apparatus 68 1995

Patent Citation Ranking

Forward Cites

Patent Info (Count) # Cites Year
 
CASCADE MICROTECH, INC. (59)
7,233,160 Wafer probe 20 2001
7,355,420 Membrane probing system 3 2002
7,178,236 Method for constructing a membrane probe using a depression 5 2003
7,761,986 Membrane probing method using improved contact 1 2003
7,400,155 Membrane probing system 0 2004
7,161,363 Probe for testing a device under test 33 2004
7,042,241 Low-current pogo probe card 1 2004
7,427,868 Active wafer probe 10 2004
7,068,057 Low-current pogo probe card 6 2005
7,266,889 Membrane probing system 7 2005
7,148,714 POGO probe card for low current measurements 3 2005
7,075,320 Probe for combined signals 2 2005
7,148,711 Membrane probing system 12 2005
7,071,718 Low-current probe card 0 2005
7,109,731 Membrane probing system with local contact scrub 15 2005
7,368,927 Probe head having a membrane suspended probe 19 2005
7,420,381 Double sided probing structures 1 2005
7,656,172 System for testing semiconductors 3 2006
7,535,247 Interface for testing semiconductors 3 2006
7,271,603 Shielded probe for testing a device under test 32 2006
7,449,899 Probe for high frequency signals 0 2006
7,619,419 Wideband active-passive differential signal probe 0 2006
7,205,784 Probe for combined signals 2 2006
7,403,025 Membrane probing system 2 2006
7,533,462 Method of constructing a membrane probe 0 2006
7,304,488 Shielded probe for high-frequency testing of a device under test 4 2006
7,764,072 Differential signal probing system 1 2007
7,723,999 Calibration structures for differential signal probing 0 2007
7,403,028 Test structure and probe for differential signals 19 2007
7,285,969 Probe for combined signals 1 2007
7,443,186 On-wafer test structures for differential signals 2 2007
7,504,842 Probe holder for testing of a test device 0 2007
7,688,097 Wafer probe 1 2007
7,609,077 Differential signal probe with integral balun 0 2007
7,681,312 Membrane probing system 0 2007
7,541,821 Membrane probing system with local contact scrub 0 2007
7,453,276 Probe for combined signals 0 2007
7,518,387 Shielded probe for testing a device under test 1 2007
7,761,983 Method of assembling a wafer probe 1 2007
7,495,461 Wafer probe 0 2007
7,456,646 Wafer probe 1 2007
7,501,842 Shielded probe for testing a device under test 0 2007
7,498,829 Shielded probe for testing a device under test 1 2007
7,417,446 Probe for combined signals 1 2007
7,489,149 Shielded probe for testing a device under test 1 2007
7,482,823 Shielded probe for testing a device under test 1 2007
7,436,194 Shielded probe with low contact resistance for testing a device under test 0 2007
7,492,175 Membrane probing system 3 2008
7,514,944 Probe head having a membrane suspended probe 1 2008
7,750,652 Test structure and probe for differential signals 2 2008
8,013,623 Double sided probing structures 0 2008
7,876,114 Differential waveguide probe 0 2008
7,759,953 Active wafer probe 0 2008
7,888,957 Probing apparatus with impedance optimized interface 1 2008
7,898,281 Interface for testing semiconductors 0 2008
7,898,273 Probe for testing a device under test 0 2009
7,893,704 Membrane probing structure with laterally scrubbing contacts 0 2009
8,410,806 Replaceable coupon for a probing apparatus 0 2009
7,940,069 System for testing semiconductors 1 2009
 
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. (1)
6,993,836 Circuit board and method of manufacturing same 0 2003
 
SHARP LABORATORIES OF AMERICA, INC. (1)
7,057,404 Shielded probe for testing a device under test 20 2003
 
SONY CORPORATION (1)
6,941,648 Method for producing printed wiring board 5 2003
 
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. (1)
8,289,727 Package substrate 0 2010
 
VIASYSTEMS, INC. (1)
7,096,555 Closed loop backdrilling system 10 2004

Maintenance Fees

Fee Large entity fee small entity fee micro entity fee due date
11.5 Year Payment $7400.00 $3700.00 $1850.00 Jul 11, 2016
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Surcharge - 11.5 year - Late payment within 6 months $160.00 $80.00 $40.00
Surcharge after expiration - Late payment is unavoidable $700.00 $350.00 $175.00
Surcharge after expiration - Late payment is unintentional $1,640.00 $820.00 $410.00