Method for measuring a gap between a proximity probe and a conductive target material
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Jan 11, 2005
Issued Date -
N/A
app pub date -
May 30, 2003
filing date -
Oct 22, 1999
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A digital eddy current proximity system including a digital impedance measuring device for digitally measuring the proximity probes impedance correlative to displacement motion and position of a metallic target object being monitored. The system further including a cable-length calibration method, an automatic material identification and calibration method, a material insensitive method, an inductive ratio method and advanced sensing characteristics.
First Claim
Family
International Classification(s)
- [Classification Symbol]
- [Patents Count]
Cited Art Landscape
Patent Citation Ranking
Advertisement
Advertisement
Advertisement
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully