Method for testing an electronic component; computer program product, computer readable medium, and computer embodying the method; and method for downloading the program embodying the method
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United States of America Patent
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Jan 11, 2005
Grant Date -
Nov 13, 2003
app pub date -
May 8, 2003
filing date -
May 8, 2002
priority date (Note) -
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Abstract
A method tests an electronic component, especially a memory chip, which is connected to a computer system. Initially, test patterns and AC-/DC-parameters are read into the computer system. Then, the computer system generates an input test pattern for the electronic component. Afterwards, a simulation process is performed processing the input test pattern by the electronic component and measuring the current flowing in the electronic component. Ultimately, the method produces a statement concerning the functionality of the tested electronic component. Program instructions for causing a computer system to perform the above-described method for testing an electronic component can be stored in a computer program, a computer readable medium, a computer memory, a read-only memory, an electrical carrier signal, and a carrier, especially a data carrier. A computer system runs the computer program embodying the method.
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