Prediction parameter analysis apparatus and a prediction parameter analysis method

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United States of America Patent

PATENT NO 6842731
APP PUB NO 20020184008A1
SERIAL NO

10145898

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A prediction parameter analysis apparatus comprises a windowing part which generates a short time input signal by subjecting an input signal or a signal derived from the input signal to windowing, a component removal part which removes an unnecessary component from the short time input signal to generate a modified short time input signal, an autocorrelation coefficient computation part which computes autocorrelation coefficients based on the modified short time input signal, and a prediction parameter computation part which computes prediction parameters based on the autocorrelation coefficients.

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Patent Owner(s)

Patent OwnerAddress
KABUSHIKI KAISHA TOSHIBAMINATO-KU TOKYO

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Inventor Name Address # of filed Patents Total Citations
Miseki, Kimio Ome, JP 48 1118

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