Probe pin assembly
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United States of America Patent
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Jan 25, 2005
Grant Date -
Oct 24, 2002
app pub date -
Mar 28, 2002
filing date -
Mar 29, 2001
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A prove pin assembly is provided in which the probe pins for a chip under test occupy the only space above the chip, not extending into the space above the adjacent chip. The probe pin assembly has a lateral array of parallel probe pins of a plurality of first perpendicular-type probe pins and a vertical array of parallel probe pins of a plurality of second perpendicular-type probe pins, wherein said lateral array of parallel probe pins and vertical array of parallel probe pins occupy different spaces for deformation above the region of the chip under test and fit in the limited planar range corresponding to the chip.
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