Intensity-based optical waveguide sensor
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United States of America Patent
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Feb 1, 2005
Grant Date -
N/A
app pub date -
May 2, 2001
filing date -
Aug 26, 1998
priority date (Note) -
Expired
status (Latency Note)
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Abstract
The invention relates to polymeric/semiconductor thin film strain gauges comprising visible light from spectrometer (10) which is directed onto a thin film passive sensor (12) having a transparent glass substrate (14) and a laminated construction in succession from the substrate (14), of a polyimide layer(18a) a polysiloxane layer (16a) filled with alumina particles, a polyimide layer (18b) and a polysiloxane layer (16b) filled with alumina particles.
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