Fluorescent X-ray analysis apparatus
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United States of America Patent
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Feb 1, 2005
Grant Date -
N/A
app pub date -
Mar 20, 2000
filing date -
Mar 18, 1999
priority date (Note) -
Expired
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Abstract
In a fluorescent X-ray analysis apparatus, a diffraction X-ray is removable from a sample even if it is formed of a mixture of fine crystals. A movable collimator mechanism capable of detecting only a collimate component of an X-ray optical flux is provided in a secondary X-ray path extending between a sample and an X-ray detector. Spectrum measurement is conducted on the same sample when the collimator mechanism is inserted and removed from the secondary X-ray path.
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