Systems and methods for non-destructively detecting material abnormalities beneath a coated surface
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United States of America Patent
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Feb 8, 2005
Grant Date -
Dec 11, 2003
app pub date -
Jun 5, 2003
filing date -
Jun 5, 2002
priority date (Note) -
Expired
status (Latency Note)
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Abstract
The present invention provides systems and methods for non-destructively detecting material abnormalities beneath a coated surface, comprising a mid-infrared (MIR) detection unit for illuminating an area of the coated surface and detecting light reflected from the illuminated area of the coated surface, and a processing unit for producing an image from optical characteristics received from the MIR detection unit. In addition, the system may further comprise a scanning unit for moving the MIR detection unit to a next area.
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