Initializing/diagnosing system in on-chip multiprocessor system

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United States of America Patent

PATENT NO 6854081
SERIAL NO

09357990

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Abstract

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A semiconductor chip of the present invention includes a plurality of first elements each of which diagnoses itself, and a second element which inputs diagnosis results from the first elements and determines whether or not there is a faulty first element in the first elements. A method of the present invention which is performed in a semiconductor chip including a plurality of first elements, includes diagnosing the first elements by itself; and determining whether or not there is a faulty first element in the first elements based on diagnosis results from the first elements.

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Patent Owner(s)

Patent OwnerAddress
NEC CORPORATIONTOKYO

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Suzuki, Katsuyuki Tokyo, JP 39 412

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