Probe contact system using flexible printed circuit board
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United States of America Patent
Stats
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Feb 22, 2005
Grant Date -
Feb 17, 2005
app pub date -
Aug 13, 2003
filing date -
Aug 13, 2003
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A probe contact system for establishing electrical connection with contact targets. The probe contact system is formed of a main frame, a flexible printed circuit board (PCB), a contactor carrier and a plurality of contactors. The flexible PCB has contact pads at a center area thereof and signal lines connected to the contact pads and extended to an end of the flexible PCB. The end of the flexible PCB with the signal lines is connected to a test head of a semiconductor test system. In one aspect, the contactor has a top spring to resiliently contact with the contact pads on the flexible PCB. In another aspect, the probe contact system includes a conductive elastomer sheet between the contactor and the flexible PCB thereby obviating the top spring of the contactor.
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