Extracted polarization intensity differential scattering for particle characterization
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United States of America Patent
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Feb 22, 2005
Grant Date -
Jul 29, 2004
app pub date -
Jan 24, 2003
filing date -
Jan 24, 2003
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Abstract
A particle sizing method and apparatus of the PIDS type uses randomly polarized radiation to irradiate a particle sample. Portions of the resulting side scattering pattern are decomposed to simultaneously produce, for each decomposed portion, first and second linearly polarized beams of radiation in which the respective planes of polarization of the two beams are mutually perpendicular. Each of the polarized beams is focused onto a photodetector, and the respective photodetector outputs are differentiated to provide PIDS signals that are useful in calculating a particle size distribution for the sample.
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