Image sensor with correlated double sampling technique using switched-capacitor technology
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United States of America Patent
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Mar 8, 2005
Grant Date -
Aug 8, 2002
app pub date -
Jun 21, 2001
filing date -
Dec 20, 2000
priority date (Note) -
Expired
status (Latency Note)
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Abstract
An output signal of an image sensor pixel, which substantially avoids fixed pattern noise contributed by the readout circuitry, is provided. The apparatus, which is used to provide an output signal that is a function of the difference between two sample signals V.sub.S1 and V.sub.S2, includes first and second capacitor elements that are coupled together at a common terminal. A reference voltage V.sub.REF is first applied to the capacitor elements, then a first sample signal V.sub.S1 from the image sensor pixel is applied to the first capacitor element producing a charge that is transferred to the second capacitor element. A second sample signal V.sub.S2 from the image sensor pixel is then applied to the first capacitor element producing a charge that is also transferred to the first capacitor element such that V.sub.O =V.sub.S2 -V.sub.S1 +V.sub.REF.
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