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Abstract

A self-calibrating test probe system of the present invention does not require probing head removal and replacement. Using the system of the present invention, the test probe and/or the entire system (including a testing instrument) may be calibrated or may self-calibrate while the probing head remains connected to an electrical component under test. The self-calibrating electrical testing probe system includes calibration circuitry including at least one input resistor, at least one relay, and at least one known calibration reference signal. If the test probe is an active test probe, the calibration circuitry may also include at least one amplifier. Each relay has a first position that provides signal access to a testing signal from an electrical component under test and a second position that provides signal access to the known calibration reference signal. Using the present invention, the error of the test probe and/or system is determined and compensated. Exemplary methods by which error compensation may be provided includes, for example, amplifying the testing signal, creating a correction table of correction values and adding an appropriate value from the correction table, or mathematically compensating.

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First Claim