Manufacturing method of semiconductor device

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 6872653
APP PUB NO 20030199156A1
SERIAL NO

10417225

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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After deposition of a conductor film made of titanium tungsten over a main surface of a semiconductor substrate formed with grooves, an initial conductor film made of aluminium is further deposited. Subsequently, the conductor film is made to reflow and run into the grooves. Thereafter, while heating, further conductor films are respectively deposited, thereby causing these conductor films to run into the grooves. The provision of the initial conductor film suppresses or prevents aluminium in the further conductor films and silicon in the semiconductor substrate from reacting with each other during reflowing of the conductor films.

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Patent Owner(s)

Patent OwnerAddress
RENESAS ELECTRONICS CORPORATIONTOKYO 135-0061

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Fujii, Yuji Tamamura, JP 167 1661

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