Connection box, system, and method for evaluating a DUT board
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United States of America Patent
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-
Mar 29, 2005
Grant Date -
May 1, 2003
app pub date -
Oct 24, 2002
filing date -
Oct 25, 2001
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
An evaluation device and method for DUT boards and probe cards which increase the reproducibility of the measured values and decrease the abrasion of pads in evaluation tests. A connection box is provided with contact pins, mounting mechanisms used to mount the DUT boards, and a plurality of connectors which feed signals from the contact pins to the outside.
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