Semiconductor device and test device for same
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United States of America Patent
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Apr 26, 2005
Grant Date -
Mar 13, 2003
app pub date -
Aug 15, 2002
filing date -
Sep 12, 2001
priority date (Note) -
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Abstract
A semiconductor device includes a quadrangular semiconductor substrate and a self test circuit formed on the semiconductor substrate. A plurality of pads are formed on the semiconductor substrate, which pads are coupled at least to the self test circuit. The semiconductor substrate includes four rectangular or square regions which each include a respective corner of the quadrangle, and at least two of the pads are respectively located on diagonally opposite ones of the regions from one another.
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