System and method for measuring system parameters and process variables using multiple sensors which are isolated by an intrinsically safe barrier
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Apr 26, 2005
Grant Date -
Jan 29, 2004
app pub date -
Jul 24, 2002
filing date -
Jul 24, 2002
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A system for measuring at least one parameter is provided. The system includes a control logic arrangement powered by a power source, and an intrinsically safe barrier operatively connected to the control logic arrangement, and also powered by the same power source. The intrinsically safe barrier is adapted to be operatively connected to at least one sensor which is also powered by the same power source. The sensor is configured to communicate data representing a parameter to the control logic arrangement via the intrinsically safe barrier. In one embodiment, the control logic arrangement, the intrinsically safe barrier and the sensor are galvonically isolated from external components and/or provided in one enclosure.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Advertisement
Advertisement
Advertisement
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully