Single sweep measurement of multiple optical characteristics
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United States of America Patent
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May 3, 2005
Grant Date -
Oct 21, 2004
app pub date -
Apr 16, 2003
filing date -
Apr 16, 2003
priority date (Note) -
Expired
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Abstract
A method of measuring multiple optical characteristics of an optical device during a single sweep of a swept wavelength optical system cyclically changes an input state of polarization on consecutive optical frequency increments of an optical signal within the wavelength range of the swept wavelength optical system. From the measured output states of polarization a wavelength-dependent Jones matrix is calculated, and from the Jones matrix the multiple optical characteristics are determined, which characteristics may include PDL and DGD.
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