Method and apparatus for analysis of schlieren
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United States of America Patent
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May 10, 2005
Grant Date -
Oct 24, 2002
app pub date -
Mar 5, 2002
filing date -
Mar 9, 2001
priority date (Note) -
Expired
status (Latency Note)
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Abstract
The method for evaluating schlieren in glassy or crystalline optical materials includes irradiating a test sample of the optical material with light and producing a shadow image of the test sample on a projection screen. The shadow image of the test sample is received in an electronic image receiving device, such as a digital camera, and is compared with another shadow image of schlieren obtained with a comparison sample by means of interferometry. Then the optical material of the test sample is evaluated with the help of the comparison results.
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