System and method for inspecting the structural integrity of visibly clear objects
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
May 17, 2005
Grant Date -
N/A
app pub date -
Apr 27, 2000
filing date -
Apr 29, 1999
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
An inspection system is provided comprising at least one detection element (60) sensitive to electromagnetic radiation (20) at a wavelength wherein the object (10) to be inspected is rendered opaque by naturally occurring material molecular absorptions. As such, material defects such as cracks and voids can be detected.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Advertisement
Advertisement
Advertisement
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully