Silicon nitride window for microsampling device and method of construction

United States of America Patent

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May 24, 2005
Grant Date
Sep 26, 2002
app pub date
Mar 26, 2001
filing date
Mar 26, 2001

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Expired

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Abstract

A silicon nitride cuvette window for a microsampling device and method of construction are provided. The sample to be analyzed is drawn into the cuvette of the microsampling device. The silicon nitride window permits optical measurements to be made on analytes contained within the cuvette.

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Patent Owner	Address
KUMETRIX INC	29524 UNION CITY BLVD UNION CITY CA 94587

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B01L:CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENE....

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Inventor Name	Address	# of filed Patents	Total Citations
Kanu, Asikeh	Oakland, CA	1	29
Smart, Wilson	Palo Alto, CA	7	895
Subramanian, Kumar	Pleasanton, CA	19	2744

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Silicon nitride window for microsampling device and method of construction

Number of patents in Portfolio can not be more than 2000

United States of America Patent

09816497

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PATENT NO	6896850
APP PUB NO	20020136667A1
SERIAL NO	09816497
DOCKET NO

US Family Size	Non-US Coverage
Patent Longevity Expired	Forward Citations

DATE PUBLISHED	PUBLICATION/PATENT NO.	PUBLICATION TYPE
May 24, 2005	US,6896850,B2 US6896850B2	GRANTED PATENT AS SECOND PUBLICATION
September 26, 2002	US,20020136667,A1 US20020136667A1	FIRST PUBLISHED PATENT APPLICATION

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09816497

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