Position measuring system and method for the assembly thereof

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 6904695
APP PUB NO 20040045182A1
SERIAL NO

10416911

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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The invention relates to a position measuring system for scanning a movement between a first element and a second element which is arranged in a moveable manner in relation to the first element. Said system comprises a material measure which can be fixed to the first element and has a scale carrier, and a scanning head which can be fixed to the second element and which scans a movement of the material measure in relation to the scanning head. The inventive system comprises a mount by which means the material measure and the scanning head can be fixed to each other in a pre-determined position, the scanning head being detachably fixed to the scale carrier. In order to assembly one such position measuring system on a first element and a second element moving in relation thereto, the scanning head is fixed to the material measure in such a way that the scanning head and the material measure are mutually fixed in position. The material measure is then applied to the first element and the scanning head to the second element, the scanning head or the material measure being fixed to the respective element, filling the gap, in the position which is pre-determined by the positioned mount. The mount between the scanning head and the material measure is then detached.

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Patent Owner(s)

Patent OwnerAddress
OPTOLAB LICENSING GMBHCLAUS-FERCK-STRASSE 5 D-22359 HAMBURG

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Franz, Heinz-Guenther Hamburg, DE 3 14
Freitag, Hans-Joachim Jena, DE 16 125
Schmidt, Andreas Erfurt, DE 466 8023

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