Methods for identification and verification using vacuum XRF system
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United States of America Patent
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Jun 21, 2005
Grant Date -
Jul 17, 2003
app pub date -
Nov 29, 2002
filing date -
Dec 5, 2001
priority date (Note) -
Expired
status (Latency Note)
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Abstract
Apparatus and methods in which one or more elemental taggants that are intrinsically located in an object are detected by x-ray fluorescence analysis under vacuum conditions to identify or verify the object's elemental content for elements with lower atomic numbers. By using x-ray fluorescence analysis, the apparatus and methods of the invention are simple and easy to use, as well as provide detection by a non line-of-sight method to establish the origin of objects, as well as their point of manufacture, authenticity, verification, security, and the presence of impurities. The invention is extremely advantageous because it provides the capability to measure lower atomic number elements in the field with a portable instrument.
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