Calibration of an analogue probe

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 6909983
APP PUB NO 20040093179A1
SERIAL NO

10471403

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Abstract

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A method of calibrating a probe mounted on a machine in which the probe has a probe calibration matrix which relates the probe outputs in three orthogonal axes to the machine's X, Y and Z coordinate system. A datum ball mounted on the machine is bi-directionally scanned by the probe in one or more planes. For each plane, the mean direction of two approximate probe vectors in the plane is rotated about an axis orthogonal to that plane until the apparent material condition from the scan in each direction is the same. This process may be iterative. The mean values of the directions of the probe vectors for each plane are rotated, thus forming a corrected probe calibration matrix. The datum ball is preferably bi-directionally scanned in three orthogonal planes.

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Patent Owner(s)

Patent OwnerAddress
RENISHAW PLCWOTTON-UNDER-EDGE

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Sutherland, Alexander Tennant Edinburgh, GB 4 160

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