System for measurement of absorbed doses of electron beams in an irradiated object
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United States of America Patent
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Jul 5, 2005
Grant Date -
Apr 29, 2004
app pub date -
Oct 24, 2002
filing date -
Oct 24, 2002
priority date (Note) -
Expired
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Abstract
A method and apparatus for measuring doses of electron beams that are absorbed by an object subjected to e-beam irradiation. The absorbed dose can be continuously measured during an irradiation process, and adjustment can be made to system parameters in accordance with the measured absorbed dose.
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