Eddy current probe having sensing elements defined by first and second elongated coils and an associated inspection method
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United States of America Patent
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Jul 5, 2005
Grant Date -
Sep 16, 2004
app pub date -
Mar 14, 2003
filing date -
Mar 14, 2003
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Abstract
An eddy current probe and associated method of inspecting a structure are provided that are capable of generating a two-dimensional image of the structure, generally in real time. The eddy current probe includes an eddy current probe array having a plurality of first and second coils that cross one another to define a plurality of sensing elements. The eddy current probe array may also include a plurality of magnetically permeable core elements located coincident with respective sensing elements and at least partially encircled by respective first and second coils. The eddy current probe may also include an alternating current source electrically connected to the first coils and sense electronics for sensing current induced in the second coils. In operation, the current sensed in the second coils represents at least one characteristic of the structure, such as the electrical conductivity of the structure.
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