In situ tumor temperature profile measuring probe and method
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United States of America Patent
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Jul 12, 2005
Grant Date -
Jul 25, 2002
app pub date -
Mar 5, 2002
filing date -
Aug 11, 2000
priority date (Note) -
Expired
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Abstract
An in situ breast tumor temperature profile measuring probe includes a rod, thermal sensors and electrical output leads. The thermal sensors are formed in spaced apart holes in an outer insulating layer of the rod and a common electrical input lead to provide an electrical input signal to the thermal sensors is disposed below and has portions exposed at the holes and electrically connected to the thermal sensors. The thermal sensors receive the electrical input signal from the common electrical input lead, sense the temperature of biological matter adjacent to the thermal sensors and produce an electrical output signal correlated thereto. Each electrical output lead mounted to the outer insulating layer is in electrical contact with a different one of the thermal sensors to receive the electrical output signal from the one thermal sensor and output the same.
First Claim
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- 15 United States
- 10 France
- 8 Japan
- 7 China
- 5 Korea
- 2 Other
Patent Owner(s)
- GENERAL ELECTRIC COMPANY
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- [Patents Count]
Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
---|---|---|---|
Hedengren, Kristina Helena Valborg | Schenectady, NY | 16 | 367 |
Kornrumpf, William Paul | Schenectady, NY | 18 | 618 |
Miller, Mark Lloyd | Schenectady, NY | 14 | 238 |
Uzgiris, Egidijus Edward | Schenectady, NY | 18 | 307 |
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Fee | Large entity fee | small entity fee | micro entity fee |
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Surcharge after expiration - Late payment is unavoidable | $700.00 | $350.00 | $175.00 |
Surcharge after expiration - Late payment is unintentional | $1,640.00 | $820.00 | $410.00 |
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