Developing photoresist with supercritical fluid and developer

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United States of America Patent

PATENT NO 6924086
SERIAL NO

10367078

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Abstract

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A method of developing a polymeric film without the need for a water rinse step. An object having a surface supporting a polymeric film is placed onto a support region within a pressure chamber. A fluid and developer is introduced into the pressure chamber and the object is processed at supercritical conditions to develop the polymeric film such that the polymeric film is not substantially deformed. The pressure chamber is then vented.

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Patent Owner(s)

Patent OwnerAddress
TOKYO ELECTRON LIMITEDTOKYO

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Arena-Foster, Chantal J Mesa, AZ 4 28
Awtrey, Allan Wendell Forth Worth, TX 4 29
Ryza, Nicholas Alan Austin, TX 5 30
Schilling, Paul Granite Bay, CA 23 572

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