Test probe for electrical devices having low or no wedge depression
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Aug 9, 2005
Grant Date -
May 27, 2004
app pub date -
Nov 20, 2003
filing date -
Oct 15, 2002
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A probe for use in detecting abnormalities in an electrical device having a wedge depression of no more than 100 mils. The probe includes a solid core surrounded by a sense coil. The ends of the core are arranged in a contact-free, spaced relationship between and at least partially above opposed surfaces of adjacent lamination teeth of a stator. Air gaps are maintained between the ends of the probe core and the opposed surfaces. The total of the two air gaps is constant. The probe is supported on a carriage arrangement and moved along the teeth. Variations in leakage flux produced with the stator energized with an energization winding to produce a flux which is a few percent of a normal energization level, are monitored.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Advertisement
Advertisement
Advertisement
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully