Scan method for built-in-self-repair (BISR)
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United States of America Patent
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Aug 9, 2005
Grant Date -
N/A
app pub date -
Jun 13, 2001
filing date -
Jun 13, 2001
priority date (Note) -
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Abstract
A system and method for protecting the values stored in a BISR repair block and, optionally, debugging the BISR repair logic without altering normal test flow is implemented by a circuit including a plurality of soft latches within the BISR repair block, the soft latches being coupled together to form a BISR scan chain for holding BISR repair information. A chip level scan enable signal and a scan hold control signal cooperate to control connection of the BISR scan chain to other scan chains during a scan test, so that the BSR repair information is held within the soft latches. A diagnose enable signal cooperating with the chip level scan enable signal and the scan hold control signal for enabling debugging of logic connecting the BISR scan chains.
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