Probe module and a testing apparatus
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United States of America Patent
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-
Aug 30, 2005
Grant Date -
Oct 28, 2004
app pub date -
Feb 10, 2004
filing date -
Aug 10, 2001
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A probe module electrically coupled to a terminal of a device under test for sending and/or receiving a signal to and/or from the device under test, includes a first substrate, a probe pin provided on the first substrate to be in contact with the terminal of the device under test, a first signal transmission pattern formed on the first substrate, the first signal transmission pattern being electrically coupled to the probe pin, with a gap formed at the first signal transmission pattern not to transmit any electric signal, and a for short-circuiting or open-circuiting the gap of the first signal transmission pattern.
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