Near field probe
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United States of America Patent
Stats
-
Sep 6, 2005
Grant Date -
Aug 4, 2005
app pub date -
Jan 29, 2004
filing date -
Jan 29, 2004
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A near field probe for testing installed components of an electromagnetic radiating system on a missile. The probe design comprises a diode antenna with a balun. The probe utilizes a dual diode arrangement which provides approximately twice the output voltage as the previous probe. The probe may then be placed further away from the radiating system under test.
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- Non-US Classification not provided for expired patents
Cited Art Landscape
Patent Citation Ranking
- Citation Ranking not provided for expired patents
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