Method for the quality control of material layers
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United States of America Patent
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Sep 13, 2005
Grant Date -
Dec 5, 2002
app pub date -
Dec 1, 2000
filing date -
Dec 6, 1999
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
Disclosed is a method for quality control of a material layer, which involves providing the material of the layer with an agent for absorbing an electromagnetic radiation, irradiating the surface of the layer with an electromagnetic radiation, and measuring the amount of light emitted by the material layer, for example, reflected radiation or fluorescence radiation.
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