Method and system for built in testing of switch functionality of tunable capacitor arrays
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United States of America Patent
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Sep 27, 2005
Grant Date -
N/A
app pub date -
Nov 1, 2002
filing date -
Nov 1, 2002
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A system and method of testing switch functionality of a tunable capacitor array is disclosed. A built in test (BIT) circuit provides digital device for testing the functionality of a programmable switch capacitor array circuit. The method and system provides for switching a capacitor switch of a switch capacitor array between on and off, switching a test enable switch of a BIT circuit between on and off, pulling an internal node of the BIT circuit either high or low using a current source, and determining whether the internal node has been pulled either high or low. In addition, the method and system provides for making a pass or fail determination based on a determined state of the internal node.
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