Differential capacitance measurement

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United States of America Patent

PATENT NO 6949937
APP PUB NO 20050134292A1
SERIAL NO

10756709

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Abstract

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A circuit and method are given, which realizes a stable yet sensitive differential capacitance measuring device with good RF-suppression and with very acceptable noise features for use in capacitive sensor evaluation systems. By evaluating the difference of capacitor values only—with the help of a switched capacitor front-end—large spreads of transducer capacitor values are tolerable. Furthermore a mode of operation can be set up, where no essential galvanic connection between sensor input and the active read-out input at any given time is existing. The solution found exhibits a highly symmetrical construction. Using the intrinsic advantages of that solution the circuit of the invention is manufactured as an integrated circuit with standard CMOS technology at low cost.

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Patent OwnerAddress
DIALOG SEMICONDUCTOR GMBHNEUE STRASSE 95 D-73230 KIRCHHEIM/TECK-NABERN

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Knoedgen, Horst Munich, DE 117 1092

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