Method of calculating device metrics
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Sep 27, 2005
Grant Date -
Dec 9, 2004
app pub date -
Jun 9, 2003
filing date -
Jun 9, 2003
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A method and system of calculating device metric is disclosed. In accordance with one embodiment, life-cycle data for devices are acquired; then, the devices are qualified based on the completeness and consistency of the data for calculating the metric. The metric is then calculated using the qualified devices data.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Advertisement
Advertisement
Advertisement
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully