Topography and recognition imaging atomic force microscope and method of operation
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United States of America Patent
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Oct 11, 2005
Grant Date -
Jul 8, 2004
app pub date -
Oct 30, 2003
filing date -
Nov 1, 2002
priority date (Note) -
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Abstract
A recognition force microscope for detecting interactions between a probe and a sensed agent on a scanned surface and methods for its operation are provided. The microscope includes a scanning probe having a tip that is sensitive to a property of the scanned surface, and the probe is adapted to oscillate with a low mechanical Q factor. Operation of the microscope includes recording the displacement of the probe tip as a function of time and simultaneously recording both topographic images and the spatial location of interactions between said probe and one or more sensed agents on the surface.
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