System and method for multiplexing inputs into a single spectrometer
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United States of America Patent
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Oct 11, 2005
Grant Date -
Apr 10, 2003
app pub date -
Oct 10, 2001
filing date -
Oct 10, 2001
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Abstract
A spectrometer for measuring the intensity of light, comprises a grating having a major axis, a first entrance aperture aligned with the grating major axis and configured to direct light energy onto the grating, wherein the grating is adapted to produce a focused light beam, a first exit aperture aligned with the grating major axis and configured to accept the focused light beam, a second entrance aperture configured to direct the light energy onto the grating, wherein the second entrance aperture is offset from the grating major axis, and a second exit aperture configured to accept the focused light beam.
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